The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Sep. 15, 2015
Lytro, Inc., Mountain View, CA (US);
Chia-Kai Liang, San Jose, CA (US);
Zejing Wang, Mountain View, CA (US);
Lytro, Inc., Mountain View, CA (US);
Abstract
Microlens positions for a light-field capture device may be calibrated. A calibration light-field image may be captured, with a microlens portion corresponding to each microlens of the light-field capture device. Interstitial spaces between the microlens portions may be identified and used to locate one or more center locations of the microlens portions. The center locations may be used to generate a model that indicates the microlens positions. Additionally or alternatively, the calibration light field image may be used to select one or more contour samples from among multiple contour samples of the microlens portions. The contour sample may be fitted to a circle centered at a center location of a microlens portion to identify the center location, which may then be used to generate a model that indicates the microlens positions. Multiple iterations may be used to enhance the accuracy of the models.