The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Aug. 24, 2015
Applicant:

Digitaloptics Corporation, San Jose, CA (US);

Inventors:

John D. Griffith, Rochester, NY (US);

Jisoo Lee, Sunnyvale, CA (US);

Assignee:

DIGITALOPTICS CORPORATION, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 5/50 (2006.01); H04N 5/262 (2006.01); H04N 5/272 (2006.01); H04N 5/225 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23296 (2013.01); G06T 5/50 (2013.01); H04N 5/2251 (2013.01); H04N 5/2253 (2013.01); H04N 5/2258 (2013.01); H04N 5/23232 (2013.01); H04N 5/2628 (2013.01); H04N 5/272 (2013.01); G02B 27/0075 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A dual sensor camera that uses two aligned sensors each having a separate lens of different focal length but the same f-number. The wider FOV image from one sensor is combined with the narrower FOV image from the other sensor to form a combined image. Up-sampling of the wide FOV image and down-sampling of the narrow FOV image is performed. The longer focal length lens may have certain aberrations introduced so that Extended Depth of Field (EDoF) processing can be used to give the narrow FOV image approximately the same depth of field as the wide FOV image so that a noticeable difference in depth of field is not see in the combined image.


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