The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Jul. 21, 2014
Applicant:

Industrial Technology Research Institute, Chutung, Hsinchu, TW;

Inventors:

Tai-Hua Hsiao, Hsinchu, TW;

Wen-Hung Chang, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/16 (2006.01); H04L 12/26 (2006.01); H04L 12/721 (2013.01);
U.S. Cl.
CPC ...
H04L 43/0864 (2013.01); H04L 43/10 (2013.01); H04L 45/36 (2013.01); H04L 45/38 (2013.01);
Abstract

A network controller for delay measurement in SDN and related delay measurement system and delay measurement method are provided. A probe packet is used to record the transmission of the probe packet between the network controller and network switches, to calculate a transport delay time between the network switches and hop delay time between the network switches, to obtain the delay of each link in the transmission path, which helps in finding out a critical hop in the SDN transmission path. Through the delay measurement mechanism according to the present disclosure, the critical hop will become a reference based on which a network manager adjusts a network framework, or a basis taken by an SDN control system to select a path.


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