The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Sep. 04, 2014
Applicant:
Ciena Corporation, Hanover, MD (US);
Inventors:
Mohammad Mehdi Mansouri Rad, Ottawa, CA;
David C. Bownass, Ottawa, CA;
Loren S. Berg, Richmond, CA;
David W. Boertjes, Nepean, CA;
Jean-Luc Archambault, Ottawa, CA;
Assignee:
Ciena Corporation, Hanover, MD (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); H04B 10/071 (2013.01); G01M 11/00 (2006.01); H04B 10/25 (2013.01); H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/31 (2013.01); G01M 11/3109 (2013.01); G01M 11/3145 (2013.01); H04B 10/25 (2013.01); H04J 14/02 (2013.01);
Abstract
A method of analysing performance of an optical fiber link. As a preliminary step, a reference trace indicative of a distributed optical performance of the optical fiber link is derived. During in-service operation of the optical fiber link, an Optical Time Domain Reflectometry (OTDR) sub-system measures an OTDR trace with Raman amplification ON, and a real-time cumulative Raman Gain profile of the optical fiber link is calculated based on the reference trace and the measured OTDR trace.