The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Aug. 22, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Fabrice Dierre, Granville, FR;

Peter Hackenschmied, Nuremberg, DE;

Matthias Strassburg, Berlin, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/18 (2006.01); H01L 31/0296 (2006.01); H01L 31/0224 (2006.01); H01L 31/115 (2006.01); C23C 18/16 (2006.01);
U.S. Cl.
CPC ...
H01L 31/1828 (2013.01); C23C 18/1605 (2013.01); C23C 18/1651 (2013.01); H01L 31/0224 (2013.01); H01L 31/0296 (2013.01); H01L 31/115 (2013.01); C23C 18/1648 (2013.01);
Abstract

A production method of a semiconductor element of a direct-converting x-ray detector is disclosed, wherein at least one intermediate layer is applied to a semiconductor layer and at least one contact layer is applied to an exposed intermediate layer by chemically currentless deposition of a contact material from a solution in each instance. The materials for the individual layers are selected such that the electrochemical potential of the materials of the at least one intermediate layer is greater than the electrochemical potential of at least one element of the semiconductor layer and the electrochemical potential of the contact material of the contract layer is greater than the electrochemical potential of the materials of the intermediate layers. Semiconductor elements produced in accordance with the method, an x-ray detector with semiconductor elements, an x-ray system with an x-ray detector and also a CT system with an x-ray detector are also disclosed.


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