The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Jul. 30, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Takeshi Takagi, Yokkaichi, JP;

Masaki Yamato, Yokkaichi, JP;

Hiroyuki Ode, Yokkaichi, JP;

Takeshi Yamaguchi, Yokkaichi, JP;

Toshiharu Tanaka, Yokkaichi, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 13/00 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0064 (2013.01); G11C 13/004 (2013.01); G11C 13/0007 (2013.01); G11C 13/0069 (2013.01);
Abstract

A nonvolatile semiconductor memory device includes: a memory cell array; and a control circuit that controls a voltage applied to this memory cell array. The memory cell array includes: a first wiring line; a second wiring line intersecting the first wiring line; and a memory cell disposed at an intersection of these lines and including a variable resistance element. In a rewrite operation of the memory cell, the control circuit repeatedly perform a pulse application operation and a verify operation, the pulse application operation applying a pulse voltage to the memory cell, and the verify operation applying a first voltage to the memory cell to determine whether the rewrite operation has been completed or not. The control circuit is configured to, in a read operation from the memory cell, apply a second voltage to the memory cell. The second voltage has a voltage value larger than the first voltage.


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