The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Feb. 17, 2009
Applicants:

Paul Allen Kesler, Arlington, VA (US);

Robert Daniel Kalinowski, Saint Charles, MO (US);

John Lyle Vian, Renton, WA (US);

Inventors:

Paul Allen Kesler, Arlington, VA (US);

Robert Daniel Kalinowski, Saint Charles, MO (US);

John Lyle Vian, Renton, WA (US);

Assignee:

THE BOEING COMPANY, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21C 17/00 (2006.01); G07C 9/00 (2006.01); G01N 21/00 (2006.01); G07C 5/00 (2006.01); G01N 21/88 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G07C 9/00111 (2013.01); G01N 21/00 (2013.01); G01N 21/01 (2013.01); G01N 21/8851 (2013.01); G07C 5/006 (2013.01); G01N 21/88 (2013.01); G01N 2291/106 (2013.01); G01N 2291/26 (2013.01);
Abstract

The advantageous embodiments provide a method for identifying anomalies on an object. The advantageous embodiments detect a presence of the object in a control area using a sensor system. In response to detecting the presence of the object in the control area, the object is identified using the sensor system. Scan priorities are identified for the object using the sensor system. The object is scanned while the object is within the control area to form scan results. The scan results are analyzed and a determination is made as to whether a number of maintenance anomalies are detected on the object using the scan results.


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