The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Jan. 04, 2009
Applicants:
Janos Rohaly, Acton, MA (US);
Ilya A. Kriveshko, Littleton, MA (US);
Dmitriy A. Dedkov, Everett, MA (US);
Inventors:
Janos Rohaly, Acton, MA (US);
Ilya A. Kriveshko, Littleton, MA (US);
Dmitriy A. Dedkov, Everett, MA (US);
Assignee:
3M INNOVATIVE PROPERTIES COMPANY, Saint Paul, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 17/00 (2006.01); A61C 13/00 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); A61C 13/0004 (2013.01); G06K 9/00201 (2013.01); G06K 9/00214 (2013.01); H04N 13/0221 (2013.01); G06T 2207/10012 (2013.01); G06T 2210/41 (2013.01);
Abstract
A three-dimensional measurement is refined by warping two-dimensional images of an object from offset camera positions according to a three-dimensional model of the object, and applying any resulting discrepancies to refine the three-dimensional model, or to refine one of a number of three-dimensional measurements used to create the three-dimensional model.