The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9418453 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 16, 2016

Filed:

Jul. 13, 2011
Applicants:

Timo Aspelmeier, Goettingen, DE;

Gernot Ebel, Goettingen, DE;

Uwe Engeland, Goettingen, DE;

Inventors:

Timo Aspelmeier, Goettingen, DE;

Gernot Ebel, Goettingen, DE;

Uwe Engeland, Goettingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 7/0012 (2013.01); G06T 11/006 (2013.01); G06T 2211/424 (2013.01); G06T 2211/436 (2013.01);
Abstract

An image reconstruction method for reconstructing an imagerepresenting a region of investigation within an object includes providing detector data (y) having Poisson random values from an X-ray transmission measurement using an X-ray source and a detector device, the detector data (y) being measured at an i-th of a plurality of different pixel positions of the detector device relative to the object, and reconstructing the imagebased on the detector data (y), the reconstructing step including a procedure of minimizing a functional whereis a current test image used for minimizing the functional F(). The imagerepresents the global minimum of F().


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