The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Mar. 14, 2012
Tilo Lilienblum, Magdeburg, DE;
Wolfram Schmidt, Stadt Falkenstein, DE;
Tilo Lilienblum, Magdeburg, DE;
Wolfram Schmidt, Stadt Falkenstein, DE;
INB Vision AG, Magdeburg, DE;
Abstract
According to the invention, a method for detecting and measuring local shape deviations in flat, curved, or domed surfaces of a test object, wherein three-dimensional measurement data (D) of the surfaces are evaluated by means of an evaluating apparatus, is designed and further developed, with regard to nondestructive testing of test objects with objective and easy-to-interpret assessment results, in such a way that the evaluating apparatus uses at least one virtual filter element as a concave filter for detecting concave sub-areas in flat or convex surfaces and/or as a convex filter for detecting convex sub-areas in flat or concave surfaces, that the filter element determines magnitudes of the shape deviations, and that said magnitudes are output by means of an outputting apparatus as measured values. The invention specifies a device for performing a corresponding method.