The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Oct. 03, 2014
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Michael J. Choiniere, Merrimack, NH (US);
Brendan P. Cirillo, Merrimack, NH (US);
Robert W. Costantino, Milford, NH (US);
Robert D. Frey, Bolton, MA (US);
Haijun Hu, Wellesley, MA (US);
Brian F. O'Donnell, Nashua, NH (US);
David A. Richards, Merrimack, NH (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
A scene correlation-based target system and related methods are provided. A reference image depicts a remotely-positioned object having identifiable characteristics, wherein a reference directional vector is established relative to the reference image. A target image of a general vicinity of the remotely-positioned object has an unknown directional vector, the target image having at least a portion of the identifiable characteristics. An inertial measuring unit has a scene correlation system, wherein the scene correlation system matches the portion of the identifiable characteristics of the target image with the identifiable characteristics of the reference image, wherein a slew angle between the reference image and the target image is calculated. A target image directional vector is derived from the calculated slew angle and the reference directional vector.