The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Sep. 16, 2014
Motion Metrics International Corp., Vancouver, CA;
Shahram Tafazoli Bilandi, Vancouver, CA;
Mohammad Sameti, Coquitlam, CA;
Nima Ziraknejad, North Vancouver, CA;
Aylin Azmin, Vancouver, CA;
Ian Law Bell, North Vancouver, CA;
Hou-Yin Daniel Ko, North Vancouver, CA;
Motion Metrics International Corp., Vancouver, CA (US);
Abstract
A method and apparatus for performing a fragmentation assessment of a material including fragmented material portions is disclosed. The method involves receiving two-dimensional image data representing a region of interest of the material, and processing the 2D image data to identify features of the fragmented material portions. The method also involves receiving a plurality of three dimensional point locations on surfaces of the fragmented material portions within the region of interest, identifying 3D point locations within the plurality of three dimensional point locations that correspond to identified features in the 2D image, and using the identified corresponding 3D point locations to determine dimensional attributes of the fragmented material portions.