The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Sep. 11, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Maria Gabrani, Thalwil, CH;

Paul T. Hurley, Oberrieden, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G01R 31/28 (2006.01); G01N 21/956 (2006.01); H01L 21/66 (2006.01); G03F 7/20 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0055 (2013.01); G06K 9/00476 (2013.01);
Abstract

A system and method for restricting the number of layout patterns by pattern identification, matching and classification, includes decomposing the pattern windows into a low frequency component and a high frequency component using a wavelet analysis for an integrated circuit layout having a plurality of pattern windows. Using the low frequency component as an approximation, a plurality of moments is computed for each pattern window. The pattern windows are classified using a distance computation for respective moments of the pattern windows by comparing the distance computation to an error value to determine similarities between the pattern windows.


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