The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Sep. 22, 2015
Enabling efficient recovery from multiple failures together with one latent error in a storage array
International Business Machines Corporation, Armonk, NY (US);
Huan He, Beijing, CN;
Mingqiang Li, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention provides a method and apparatus of managing a storage array. The method comprises: striping the storage array to form a plurality of stripes; selecting F storage chunks from each stripe as local parity chunks, and selecting another L storage chunks from the storage array as global parity chunks; performing (F+L) fault tolerant erasure coding on all data chunks in a stripe to generate (F+L) groups of parity data, and storing F groups of parity data therein into the F local parity chunks; performing cross-stripe operation on another L groups of parity data to generate L groups of global parity data, and storing them into the L global parity chunks, respectively. The apparatus corresponds to the method. With the invention, a plurality of errors in the storage array can be detected and/or recovered to improve fault tolerance and space utilization of the storage array.