The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Jun. 20, 2012
Applicants:

Greg Thiel, Black Diamond, WA (US);

Jon Avner, Bellevue, WA (US);

Yogesh Bansal, Redmond, WA (US);

Inventors:

Greg Thiel, Black Diamond, WA (US);

Jon Avner, Bellevue, WA (US);

Yogesh Bansal, Redmond, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0709 (2013.01); G06F 11/0781 (2013.01); G06F 11/3006 (2013.01);
Abstract

Systems, methods, and software are provided for dynamically escalating service conditions associated with data center failures. In one implementation, a monitoring system detects a service condition. The service condition may be indicative of a failure of at least one service element within a data center monitored by the monitoring system. The monitoring system determines whether or not the service condition qualifies for escalation based at least in part on an access condition associated with the data center. The access condition may be identified by at least another monitoring system that is located in a geographic region distinct from that of the first monitoring system. Upon determining that the service condition qualifies for escalation, the monitoring system escalates the service condition to an escalated condition and initiates an escalated response.


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