The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Nov. 22, 2010
Applicants:

Mark Maiolani, East Kilbride, GB;

Alistair Robertson, Glasgow, GB;

Inventors:

Mark Maiolani, East Kilbride, GB;

Alistair Robertson, Glasgow, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); F02D 41/06 (2006.01); F02D 41/24 (2006.01); F02D 41/26 (2006.01);
U.S. Cl.
CPC ...
G06F 9/4401 (2013.01); F02D 41/064 (2013.01); F02D 41/2432 (2013.01); F02D 41/2487 (2013.01); F02D 41/266 (2013.01); G06F 9/4403 (2013.01);
Abstract

A method for enabling calibration during start-up of a micro controller unit device is provided. The method comprises, within the MCU device, reading overlay initialization data from at least one memory element within an external support device operably coupled to the MCU device, and configuring memory mapping functionality of the MCU device to overlay data stored within at least a part of device memory of the MCU device with calibration data stored within the at least one memory element of the external support device in accordance with the overlay initialization data.


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