The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
May. 15, 2013
Applicant:
Ihs Global Inc., Englewood, CO (US);
Inventors:
Yingwei Yu, Katy, TX (US);
Clifford L. Kelley, Sugar Land, TX (US);
Irina M. Mardanova, Houston, TX (US);
Assignee:
IHS GLOBAL INC., Englewood, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/302 (2013.01);
Abstract
Picking a fault in seismic data samples is described. In one example, a minimum spanning tree is used. In another example, input seismic attribute data is determined based on the seismic data samples. Seeds are selected that represent locations in the seismic volume using the attribute data. A principle grid is generated using the seeds. A fault is picked in the seismic volume by applying a least costs process, for example a minimum spanning tree, to the principle grid. The fault is then interpolated to generate a fault surface of the seismic volume.