The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Apr. 16, 2014
Ifg—institute for Scientific Instruments Gmbh, Berlin, DE;
Helmholtz-zentrum Berlin Fur Materialien Und Energie Gmbh, Berlin, DE;
IfG—Institute for Scientific Instruments GmbH, Berlin, DE;
Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin, DE;
Abstract
The present invention relates to a method and device for determining the energetic composition of electromagnetic waves. It is the object of the present invention to provide a method and device for X-ray spectroscopy that allows simultaneous detection of the individual energies at a comparatively higher resolution and/or across a comparatively wider energy range. According to the invention, at least one reflective zone plate () is used that comprises a multitude of predefined wavelength-selective regions () arranged next to one another, wherein the wavelength-selective regions () each include a multitude of reflecting arched portions (), which extend exclusively and continuously across the respective wavelength-selective region ().