The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Apr. 09, 2012
Applicant:

Hideki Yamada, Chofu, JP;

Inventor:

Hideki Yamada, Chofu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/22 (2010.01); G01S 19/28 (2010.01); G01S 19/43 (2010.01);
U.S. Cl.
CPC ...
G01S 19/22 (2013.01); G01S 19/28 (2013.01); G01S 19/43 (2013.01);
Abstract

A selection method of satellites for RTK positioning calculation includes initializing a mask threshold of the elevation angle mask and/or the signal strength mask, setting the mask threshold as a first mask threshold other than a mask threshold which carried out an initial setting, performing a first RTK positioning calculation based on a signal from the satellite, performing a first quality check about a positioning solution in the first RTK positioning calculation, and when the first quality check is under the threshold of the ratio test, performing a second RTK positioning calculation based on the signal from the satellite newly chosen via the first mask threshold and performing a second quality check about a second positioning solution in the second RTK positioning calculation.


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