The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Sep. 03, 2010
Applicants:
Takaaki Nagai, Kobe, JP;
Masaharu Shibata, Kobe, JP;
Yuichi Hamada, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Inventors:
Takaaki Nagai, Kobe, JP;
Masaharu Shibata, Kobe, JP;
Yuichi Hamada, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe-Shi, Hyogo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G06F 15/00 (2006.01); G01N 35/02 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); G01N 35/0092 (2013.01); G01N 35/0095 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/0412 (2013.01); G01N 2035/0484 (2013.01); Y10T 436/114165 (2015.01);
Abstract
This analysis apparatus includes a plurality of a plurality of measurement units of mutually identical types generating measurement data by measuring the specimens, a transporter transporting the specimens to the respective ones of the plurality of measurement units, a display, common to the plurality of measurement units, displaying the analytical results generated by analyzing the measurement data and a transmitter transmitting the analytical results to a host computer.