The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Oct. 28, 2009
Yasuo Yonekura, Kobe, JP;
Yuichiro Ohmae, Kobe, JP;
Tokihiro Kosaka, Kakogawa, JP;
Takaaki Nagai, Kobe, JP;
Yasuo Yonekura, Kobe, JP;
Yuichiro Ohmae, Kobe, JP;
Tokihiro Kosaka, Kakogawa, JP;
Takaaki Nagai, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
A specimen processing system comprising: a specimen measuring section for measuring specimens accommodated in specimen containers; a transport section for transporting specimen containers to the specimen measuring section; a specimen container collect section for collecting specimen containers; an obtainer for obtaining shape information on specimen containers or state information on specimens accommodated in specimen containers; a supply judger configured for determining whether specimen containers are to be supplied to the specimen measuring section on the basis of the result obtained by the obtainer; and a delivery section for delivering specimen containers, which are determined to be supplied to the specimen measuring section by the supply judger, toward the transport section, and delivering specimen containers, which are determined not to be supplied to the specimen measuring section by the supply judger, toward the specimen container collect section, is disclosed. A specimen container classifying apparatus is also disclosed.