The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Nov. 20, 2008
Takashi Nakagawa, Kyoto, JP;
Shinya Nakajima, Kyoto, JP;
Tokuo Kasai, Kyoto, JP;
Kyouichi Ohshiro, Kyoto, JP;
Takashi Nakagawa, Kyoto, JP;
Shinya Nakajima, Kyoto, JP;
Tokuo Kasai, Kyoto, JP;
Kyouichi Ohshiro, Kyoto, JP;
ARKRAY, Inc., Kyoto-shi, JP;
Abstract
An object is to provide an optical measurement apparatus for performing an efficient test by optical measurement without incurring incorrect measurements. To this end, the measurement apparatus utilizes a test instrument mounted thereto and including a carrier with a reagent retaining portion for application of a sample. The measurement apparatus includes a reader for color development at the reagent retaining portion, and a controller for driving control of the reader and for required determination. The controller performs the determination by utilizing the data obtained by reading the color development of the reagent after a reaction completion period Tr-Trdepending on the reagent and starting from the mounting of the test instrument. When detecting that the color development at the reagent retaining portion is completed before the lapse of the reaction completion period Tr-Trafter the mounting of the test instrument, the controller stops the test for the test instrument.