The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Dec. 03, 2014
Applicant:

Bourns, Inc., Riverside, CA (US);

Inventor:

James Gregory Stanley, Novi, MI (US);

Assignee:

BOURNS, INC., Riverside, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 27/22 (2006.01); G01F 23/00 (2006.01); G01F 11/00 (2006.01); G01F 1/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/228 (2013.01); G01F 1/00 (2013.01); G01F 11/00 (2013.01); G01F 23/00 (2013.01);
Abstract

Systems and methods for making repeatable measurements of the dielectric constant and conductivity of a material, such as a liquid. In one example, a material property measurement system includes a measurement cell, a voltage measurement circuit, a capacitor, and a switch. The measurement cell is made of at least two conducting electrodes with liquid between the conducting electrodes. The switch is in a current path between the capacitor and the measurement cell. The capacitor is charged and then the switch is closed for a first time period and a first voltage measurement on the capacitor is performed. The capacitor is charged again and the switch is closed for a second time period and a second voltage measurement on the capacitor is performed. The two voltage measurements are used in a calculation to calculate a value related to capacitance between the at least two conducting electrodes of the measurement cell.


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