The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Oct. 10, 2013
Bruker Axs Inc., Madison, WI (US);
Joerg Kaercher, Madison, WI (US);
Other;
Abstract
A method of centering a single crystal sample in the X-ray beam of a diffractometer uses detection of diffraction spots with an active pixel sensor operated in rolling shutter mode. A sample is mounted in the automated goniometer head of the diffractometer and an approximate center of the sample found through which three perpendicular sample axes pass. With a first sample axis perpendicular to a center axis of the X-ray beam, the sample is moved along the first axis from a first position outside of the beam, through the beam and then to a second position outside of the beam. The positions at which first the presence and then the absence of diffraction spots are detected are determined, and the steps repeated for each of the other two perpendicular directions. A precise center may then be found by determining the centroid of the six coordinates thereby obtained.