The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Oct. 21, 2013
Applicant:

Google Inc., MountainView, CA (US);

Inventors:

James R. Bruce, Sunnyvale, CA (US);

Ryan Hickman, Mountain View, CA (US);

James J. Kuffner, Jr., Mountain View, CA (US);

Arshan Poursohi, Berkeley, CA (US);

Assignee:

Google Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G06T 15/04 (2011.01); G06T 15/00 (2011.01); G06T 7/40 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G06T 7/40 (2013.01); G06T 15/00 (2013.01); G06T 15/04 (2013.01);
Abstract

Methods and systems for controlling light arrays to determine properties of an object are described. An example method includes causing illumination of a surface of an object from multiple illumination positions using a programmable array of lights, and receiving images from an image-capture device while the surface of the object is illuminated. For example, the programmable array of lights may be modulated to cause illumination of a portion of the surface of the object from first and second illumination positions, and a first and second image of the surface of the object captured during illumination from the first and second illumination positions respectively may be received. Subsequently, a processor may determine material information for the object based on an amount of specular reflectivity for the surface of the object and reference to a database of known amounts of specular reflectivity for a plurality of materials.


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