The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Dec. 29, 2015
Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventors:

Atsushi Nakanishi, Hamamatsu, JP;

Kazuki Horita, Hamamatsu, JP;

Takashi Yasuda, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/3586 (2014.01); G01N 21/47 (2006.01); G01N 21/3563 (2014.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01); G01N 21/3563 (2013.01); G01N 21/3581 (2013.01); G01N 21/4795 (2013.01); G01N 2201/06113 (2013.01);
Abstract

A terahertz wave temporal waveform acquisition apparatus includes a light source, a branch part, a terahertz wave generation element, a terahertz wave detection element, a delay providing medium, a temperature adjustment unit, and an analysis unit. The delay providing medium is disposed on an optical path of a terahertz wave from the terahertz wave generation element to the terahertz wave detection element, is formed of a material of which a refractive index for the terahertz wave depends on the temperature, and provides a delay according to the temperature to the terahertz wave.


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