The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Jun. 05, 2013
Applicant:
Sony Corporation, Tokyo, JP;
Inventor:
Nao Nitta, Tokyo, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 11/02 (2006.01); G01N 21/21 (2006.01); G01N 21/64 (2006.01); G01N 15/14 (2006.01); G01N 21/53 (2006.01); G01F 1/66 (2006.01); G01N 15/10 (2006.01); G01N 11/00 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 11/02 (2013.01); G01F 1/661 (2013.01); G01N 15/1404 (2013.01); G01N 15/1459 (2013.01); G01N 21/21 (2013.01); G01N 21/53 (2013.01); G01N 21/64 (2013.01); G01N 2011/008 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1415 (2013.01); G01N 2021/4792 (2013.01); G01N 2021/6417 (2013.01); G01N 2021/6493 (2013.01);
Abstract
There is provided a laminar flow monitoring method in a fine particle measurement device, the method including a radiation step of radiating light to a laminar flow, a position detection step of receiving, by a detector, an S polarized component which is separated from scattered light produced from the laminar flow and to which astigmatism is given and acquiring light reception position information of the S polarized component in the detector, and a determination step of determining a state of the laminar flow based on the light reception position information.