logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9417173 B1

PDFFull Text
Date of Patent:
Aug. 16, 2016

Filed:

Jun. 05, 2013

Fine particle measurement device, and laminar flow monitoring method and fine particle analysis method in fine particle measurement device

Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Nao Nitta, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:

Wolf, Greenfield & Sacks, P.C.

Primary Examiner:

Michael P Stafira

Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 11/02 (2006.01); G01N 21/21 (2006.01); G01N 21/64 (2006.01); G01N 15/14 (2006.01); G01N 21/53 (2006.01); G01F 1/66 (2006.01); G01N 15/10 (2006.01); G01N 11/00 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 11/02 (2013.01); G01F 1/661 (2013.01); G01N 15/1404 (2013.01); G01N 15/1459 (2013.01); G01N 21/21 (2013.01); G01N 21/53 (2013.01); G01N 21/64 (2013.01); G01N 2011/008 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1415 (2013.01); G01N 2021/4792 (2013.01); G01N 2021/6417 (2013.01); G01N 2021/6493 (2013.01);
Abstract

There is provided a laminar flow monitoring method in a fine particle measurement device, the method including a radiation step of radiating light to a laminar flow, a position detection step of receiving, by a detector, an S polarized component which is separated from scattered light produced from the laminar flow and to which astigmatism is given and acquiring light reception position information of the S polarized component in the detector, and a determination step of determining a state of the laminar flow based on the light reception position information.

Find Patent Forward Citations

Nitta, Nao. (2016). Fine particle measurement device, and laminar flow monitoring method and fine particle analysis method in fine particle measurement device (U.S. Patent No. 9417173). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9417173

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…