The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Jul. 16, 2012
Applicants:
Igor Sokolov, Potsdam, NY (US);
Maxim Evgenevich Dokukin, Potsdam, NY (US);
Inventors:
Igor Sokolov, Potsdam, NY (US);
Maxim Evgenevich Dokukin, Potsdam, NY (US);
Assignee:
CLARKSON UNIVERSITY, Potsdam, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 25/00 (2006.01); G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
G01N 3/32 (2013.01); G01N 2203/0094 (2013.01); G01N 2203/0218 (2013.01);
Abstract
The present invention provides an apparatus and method including hardware and software, which allows collecting and analyzing of data to obtain information about mechanical properties of soft materials. This allows surface mapping of viscoelastic properties in a high-resolution and fast manner. It also allows finding the degree of nonlinearity of the material response of the sample during the measurements. The apparatus can be used as a stand-alone device, or an add-on to either the existing atomic force microscope or nanoindenter device.