The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Mar. 06, 2014
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Soo Chul Lim, Seoul, KR;
Joon Ah Park, Seoul, KR;
Hyun Jeong Lee, Hwaseong-si, KR;
Seung Ju Han, Seoul, KR;
Kyung Won Moon, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01L 1/24 (2006.01); G06F 3/041 (2006.01); G06F 3/042 (2006.01); G01L 5/10 (2006.01);
U.S. Cl.
CPC ...
G01L 1/246 (2013.01); G06F 3/0414 (2013.01); G06F 3/0421 (2013.01); G01L 5/105 (2013.01);
Abstract
An apparatus and method for measuring bending of an object, a position of an item touching the object, and a shearing force of the item using an optical waveguide may include a frequency measurer to measure a frequency of light reflected from a grating of an optical waveguide, and a bending measurer to determine bending of an object to which the optical waveguide is attached using the frequency.