The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2016
Filed:
Dec. 13, 2010
Applicants:
Toshiaki Sudo, Akita, JP;
Hiroshi Kishi, Akita, JP;
Inventors:
Toshiaki Sudo, Akita, JP;
Hiroshi Kishi, Akita, JP;
Assignee:
SUMCO CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 35/00 (2006.01); C30B 15/10 (2006.01); C03B 19/09 (2006.01);
U.S. Cl.
CPC ...
C30B 15/10 (2013.01); C03B 19/095 (2013.01); C30B 35/002 (2013.01); Y02P 40/57 (2015.11); Y10T 117/1032 (2015.01);
Abstract
Provided is a vitreous silica crucible having a reference point, which is capable of accurately detecting the location of a defect in the vitreous silica crucible used for pulling silicon single crystal, determining a defect generating site of silicon single crystal, and investigating the cause of the defect. The reference point used for specifying the position relationship with respect to a particular part is formed in at least one site of an end portion, an inner wall and an outer wall of the crucible.