The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Aug. 29, 2006
Applicants:

Thomas Alan Kerekes, Calabasas, CA (US);

Jouni P. Partanen, Palo Alto, CA (US);

Yong Chen, Valencia, CA (US);

Charles W. Hull, Santa Clarita, CA (US);

Inventors:

Thomas Alan Kerekes, Calabasas, CA (US);

Jouni P. Partanen, Palo Alto, CA (US);

Yong Chen, Valencia, CA (US);

Charles W. Hull, Santa Clarita, CA (US);

Assignee:

3D Systems, Inc., Rock Hill, SC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2006.01);
U.S. Cl.
CPC ...
B29C 67/0066 (2013.01); B29C 67/0088 (2013.01); B29K 2995/0073 (2013.01);
Abstract

A solid imaging apparatus and method employing levels of exposure varied with gray scale or time or both of digitally light projected image of a cross-section of a three-dimensional object on a solidifiable photopolymer build material. The gray scale levels of exposure of projected pixels permits the polymerization boundaries in projected boundary pixels to be controlled to achieve preserved image features in a three-dimensional object and smooth out rough or uneven edges that would otherwise occur using digital light projectors that are limited by the number of pixels in an image projected over the size of the image. Software is used to control intensity parameters applied to pixels to be illuminated in the image projected in the cross-section being exposed in the image plane.


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