The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Sep. 19, 2013
Applicant:

Luxray Dental Systems, Inc., Portland, OR (US);

Inventor:

Peter S. Lovely, Portland, OR (US);

Assignee:

LuxRay Dental Systems, Inc., Portland, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61C 3/00 (2006.01); A61B 5/00 (2006.01); A61C 13/00 (2006.01); A61C 19/04 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0088 (2013.01); A61B 5/0086 (2013.01); A61C 13/0004 (2013.01); A61C 19/04 (2013.01);
Abstract

Dental imaging systems include an optical scanner that scans one or more interrogation beams across a portion of at least one tooth to produce a dentally modulated light flux associated with light scattering, absorption, or other interaction of the interrogation beam and a tooth interior. The dentally modulated light flux is detected and processed to produce picture information associated with the tooth. Interrogation wavelengths between 800 nm and 1800 nm can be used to provide images suitable for diagnosis and assessment of demineralization or other defects. Interrogation beams at one or more wavelengths can be used. Multiple detectors can be situated to receive dentally modulated light fluxes at different wavelengths or dentally modulated light fluxes with different directions or different locations. Markers at or on a tooth can be used to for depth determination. Index matching to the tooth can improve image quality.


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