The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2016

Filed:

Feb. 13, 2007
Applicants:

Jan W. Kokkelink, Blairstown, NJ (US);

Talal K. Findakly, Hackettstown, NJ (US);

Inventors:

Jan W. Kokkelink, Blairstown, NJ (US);

Talal K. Findakly, Hackettstown, NJ (US);

Assignee:

Micro-Optics, Inc., Hackettstown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/14 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0073 (2013.01); A61B 5/0066 (2013.01); A61B 5/0088 (2013.01);
Abstract

An optical probe suitable for medical or dental tomography is switchable between a rotating and non-rotating mode to control interference between source signals and data signals. The probe is suitably constructed in an in-line configuration and uses Faraday rotators which rotate polarization in the same direction in a rotating mode and rotate polarization in opposite directions in a non-rotating mode.


Find Patent Forward Citations

Kokkelink, Jan. (2016). Tomography probe (U.S. Patent No. 9414748). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9414748

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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