The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Dec. 31, 2013
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
Jackson Salling, Austin, TX (US);
J. David Schell, Austin, TX (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/02 (2006.01); H05B 33/08 (2006.01); H01S 5/024 (2006.01); H01S 5/0683 (2006.01); G01K 13/00 (2006.01); H05B 37/02 (2006.01); H01S 5/06 (2006.01);
U.S. Cl.
CPC ...
H05B 33/0809 (2013.01); G01K 13/00 (2013.01); H01S 5/02453 (2013.01); H01S 5/06837 (2013.01); H05B 37/02 (2013.01); H01S 5/0617 (2013.01);
Abstract
A self-contained calibration method for improving stability of an optical source in an optical network test instrument includes performing a temperature sweep test of the optical source. Optical output power of the optical source is periodically measured. A temperature correcting value is generated based on the measured optical output power. The optical output power of the optical source is adjusted by applying the temperature correcting value to obtain a substantially constant optical output power of the optical source.