The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Mar. 09, 2015
Applicant:

Victor M. Zinevich, Voronezh, RU;

Inventor:

Victor M. Zinevich, Voronezh, RU;

Assignee:

ARCOM DIGITAL, LLC, Syracuse, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 21/647 (2011.01); H04N 21/61 (2011.01);
U.S. Cl.
CPC ...
H04N 21/6473 (2013.01); H04N 17/004 (2013.01); H04N 21/6118 (2013.01); H04N 21/6168 (2013.01);
Abstract

Detecting a linear impairment in a cable under test by using a random signal transmitted down the cable. The impairment causes a reflected signal to be combined with the random signal. The combined signal extends over a plurality of sub-bands. A method and apparatus perform the steps of: (a) receiving the combined signal from a test point upstream from the impairment; (b) tuning to each sub-band and receiving a part of the combined signal within each sub-band; (c) determining an autocorrelation function of each part of the combined signal of each sub-band, to produce a plurality of autocorrelation functions; (d) combining the autocorrelation functions to form a combined function; (e) detecting the reflected signal from the combined function; and (f) determining, from the combined function, a time delay associated with the reflected signal and the distance from the test point to the impairment.


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