The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Mar. 07, 2014
Applicant:
Jdsu Deutschland Gmbh, Eningen, DE;
Inventors:
Reiner Schnizler, Beuren, DE;
Paul Brooks, Ofterdingen, DE;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/24 (2006.01); H04L 25/06 (2006.01); H04L 1/20 (2006.01); G06F 7/58 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H04L 1/241 (2013.01); H04L 1/20 (2013.01); H04L 25/064 (2013.01); G01R 31/2822 (2013.01); G01R 31/2839 (2013.01); G06F 7/58 (2013.01);
Abstract
The invention relates to a method and device for testing a data link. A single-lane or multi-lane bit error tester that transmits one or more PRBS signals through the data link is augmented with a raw bit error buffer for storing bit error information for each detected error event and an error pattern analyzer. Most frequently occurring intra-lane bit error patterns, inter-lane word error patterns, and bit slip patterns are identified and their characteristics are analyzed so as to provide information indicative of root causes of the detected bit errors and bit slips.