The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Feb. 28, 2013
National Instruments Ireland Resources Limited, Dublin, IE;
Marc Vanden Bossche, Bornem, BE;
National Instruments Ireland Resources Limited, Dublin, IE;
Abstract
The present invention relates to a method for characterizing at a given frequency reflected waves of a frequency translating device having at least two ports, whereby information is available on the phase of a local oscillator driving the frequency translating device. The method comprises the steps of—applying at the at least two ports at least a tone at said given frequency and tones at said given frequency offset by the local oscillator signal frequency,—rotating the phase of the applied tone at said given frequency or exploiting a phase rotation of the local oscillator signal,—measuring at said given frequency amplitude and phase of reflected waves at the at least two ports and measuring at said given frequency and at said given frequency offset by the frequency of the local oscillator signal amplitude and phase of incident waves at the at least two ports,—determining parameters for a model of the frequency translating device by relating the amplitude and phase of the reflected waves to the incident waves, taking into account at least the local oscillator signal phase.