The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Feb. 17, 2011
Vacuum ultraviolet photoionization and chemical ionization combined ion source for mass spectrometry
Haiyang LI, Dalian, CN;
Lei Hua, Dalian, CN;
Qinghao Wu, Dalian, CN;
Huapeng Cui, Dalian, CN;
Keyong Hou, Dalian, CN;
Haiyang Li, Dalian, CN;
Lei Hua, Dalian, CN;
Qinghao Wu, Dalian, CN;
Huapeng Cui, Dalian, CN;
Keyong Hou, Dalian, CN;
DALIAN INSTITUTE OF CHEMICAL PHYSICS, CHINESE ACADEMY OF SCIENCES, Dalian, Liaoning, CN;
Abstract
This invention relates to the field of mass spectrometry, and more specifically to a vacuum ultraviolet photoionization and chemical ionization combined ion source, which consists of a vacuum ultraviolet light source and an ion source chamber. An ion acceleration electrode, an ion repulsion electrode, an ion extraction electrode, and a differential interface electrode positioned inside the ion source chamber are arranged along the exit direction of the vacuum ultraviolet light beam in sequence and spaced, coaxial, and parallel from each other. The ion acceleration electrode, the ion repulsion electrode, the ion extraction electrode, and the differential interface electrode are all plate structures with central through holes. The vacuum ultraviolet light beam passes through the central through holes of the electrodes along the axial direction. By utilizing a single vacuum ultraviolet light source, the ion source is feasible to switch between two ionization modes, vacuum ultraviolet photoionization (VUV PI) and chemical ionization (CI), under suitable ion source pressure, thus greatly expanding the range of detectable samples.