The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

May. 09, 2013
Applicant:

Uchicago Argonne, Llc, Chicago, IL (US);

Inventors:

Daniel Lopez, Chicago, IL (US);

Gopal Shenoy, Naperville, IL (US);

Jin Wang, Burr Ridge, IL (US);

Donald A. Walko, Woodrige, IL (US);

Il-Woong Jung, Woodridge, IL (US);

Deepkishore Mukhopadhyay, Ventura, CA (US);

Assignee:

uchicago Argonne, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G21K 1/06 (2013.01); G21K 2201/062 (2013.01);
Abstract

A method and apparatus are provided for implementing Bragg-diffraction leveraged modulation of X-ray pulses using MicroElectroMechanical systems (MEMS) based diffractive optics. An oscillating crystalline MEMS device generates a controllable time-window for diffraction of the incident X-ray radiation. The Bragg-diffraction leveraged modulation of X-ray pulses includes isolating a particular pulse, spatially separating individual pulses, and spreading a single pulse from an X-ray pulse-train.


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