The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
May. 25, 2010
Nelson Liang an Chang, San Jose, CA (US);
Suk Hwan Lim, Mountain View, CA (US);
Feng Tang, Mountain View, CA (US);
Nelson Liang An Chang, San Jose, CA (US);
Suk Hwan Lim, Mountain View, CA (US);
Feng Tang, Mountain View, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A reference set of image features is determined from an electronic data file specifying a reference image in a reference coordinate space. Rendering information describing a physical rendering of the reference image is ascertained. Calibration-enabling data is derived from the reference set of the image features and the ascertained rendering information. The calibration-enabling data is provided to calibrate an imaging system. The calibration-enabling data may be stored. The imaging system may capture an image of the physical rendering of the reference image in relation to a capture coordinate space. An extracted set of image features may be extracted from the captured image. Respective ones of the image features in the reference and extracted sets may be matched. The imaging system may be calibrated based on matched ones of the image features and the rendering information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile