The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Dec. 04, 2013
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Chen Feng, Ann Arbor, MI (US);

Yuichi Taguchi, Arlington, MA (US);

Vineet Kamat, Cambridge, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/48 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/48 (2013.01); G06K 9/00664 (2013.01); G06K 9/469 (2013.01); G06K 9/4638 (2013.01); G06T 7/0083 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20141 (2013.01);
Abstract

A method extracts planes from three-dimensional (3D) points by first partitioning the 3D points into disjoint regions. A graph of nodes and edges is then constructed, wherein the nodes represent the regions and the edges represent neighborhood relationships of the regions. Finally, agglomerative hierarchical clustering is applied to the graph to merge regions belonging to the same plane.


Find Patent Forward Citations

Feng, Chen. (2016). Method for extracting planes from 3d point cloud sensor data (U.S. Patent No. 9412040). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9412040

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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