The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Jul. 17, 2008
Applicants:

Benjamin A. Flusberg, Palo Alto, CA (US);

Mark Jacob Schnitzer, Stanford, CA (US);

Tony H. Ko, San Jose, CA (US);

Inventors:

Benjamin A. Flusberg, Palo Alto, CA (US);

Mark Jacob Schnitzer, Stanford, CA (US);

Tony H. Ko, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G02B 23/24 (2006.01); A61B 5/00 (2006.01); G02B 3/00 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 23/2423 (2013.01); A61B 5/0059 (2013.01); G02B 3/0087 (2013.01); G02B 27/0025 (2013.01);
Abstract

Micro-optical imaging is facilitated. According to an example embodiment, a micro-optical probe arrangement includes a GRIN-type lens probe to direct light to and from a specimen. Compensation optics tailored to the probe and aberrations introduced by the lens are located in a light path through the lens, and compensate for the introduced aberrations. A light detector detects light from the specimen, as facilitated by the compensation optics, and generates data characterizing an image of the specimen.


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