The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Sep. 27, 2013
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Frank Schreiber, Dossenheim, DE;
Lioba Kuschel, Mannheim, DE;
Patric Mrawek, Neustadt, DE;
Bernd Widzgowski, Dossenheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope, in particular a confocal microscope, has one or more lasers for generating an illumination light for a sample and has a detection device for detected signals from the sample. The detection device includes multiple adjustable spectral detection channels for the detection of predefinable different wavelength regions, and is configured and refined in the interest of particularly versatile utilization in consideration of a wide variety of phenomena, with particularly good separation of the phenomena in the context of investigation, in such a way that multiple temporal detection windows are respectively settable for the spectral detection channels.