The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Nov. 21, 2011
Delphine Debarre, Paris, FR;
Thibault Vieille, Noisy-le-Roy, FR;
Emmanuel Beaurepaire, Palaiseau, FR;
Jean-louis Martin, Bures sur Yvette, FR;
Delphine Debarre, Paris, FR;
Thibault Vieille, Noisy-le-Roy, FR;
Emmanuel Beaurepaire, Palaiseau, FR;
Jean-Louis Martin, Bures sur Yvette, FR;
ECOLE POLYTECHNIQUE, Palaiseau, FR;
Abstract
A method and system for calibrating an optical device having a spatial optical modulator () and including: an optical lens () of a large numerical aperture, capable of receiving an incident beam and/or collecting an optical beam reflected by a sample; a camera () disposed in a plane optically conjugate with the focal plane of the lens (); and a spatial optical modulator () disposed on the optical beam upstream of the camera (). The method includes the following steps consisting in: acquiring three-dimensional images of the PSF in terms of intensity in a plane conjugate with the focal plane of the lens (), reconstructing the profile in terms of amplitude and/or phase of the beam using a phase diversity algorithm, and determining the respective influence functions of a plurality of elements P, . . . , Pof the spatial optical modulator () on the profile in terms of the amplitude A and/or phase φ of the beam.