The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Oct. 29, 2012
Applicant:
The Regents of the University of Michigan, Ann Arbor, MI (US);
Inventors:
Valeria Bertacco, Ann Arbor, MI (US);
Andrew DeOrio, Ann Arbor, MI (US);
Daya Shanker Khudia, Ann Arbor, MI (US);
Assignee:
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 29/26 (2006.01); G01R 27/28 (2006.01); G06F 11/263 (2006.01); G01R 31/3183 (2006.01); G06F 11/26 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2601 (2013.01); G01R 27/28 (2013.01); G01R 29/26 (2013.01); G01R 31/3183 (2013.01); G01R 31/318544 (2013.01); G06F 11/261 (2013.01); G06F 11/263 (2013.01);
Abstract
The system and method described herein relate to a bug positioning system for post-silicon validation of a prototype integrated circuit using statistical analysis. Specifically, the bug positioning system samples output and intermediate signals from a prototype chip to generate signatures. Signatures are grouped into passing and failing groups, modeled, and compared to identify patterns of acceptable behavior and unacceptable behavior and locate bugs in space and time.