The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Jan. 16, 2014
Applicant:

Elionix Inc., Tokyo, JP;

Inventors:

Hironao Amemiya, Tokyo, JP;

Hayato Kobayashi, Tokyo, JP;

Takahisa Kato, Tokyo, JP;

Assignee:

ELIONIX INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01); G01Q 10/06 (2010.01); G01Q 60/38 (2010.01); G01Q 20/04 (2010.01); G01Q 10/00 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/38 (2013.01); G01Q 10/00 (2013.01); G01Q 20/04 (2013.01); G01N 2203/0286 (2013.01);
Abstract

The present invention provides a method and an apparatus for measuring a force (which will be referred to as surface force) acting between two material surfaces. A surface force measuring method includes moving an object () toward a probe () until the probe () is adsorbed to the object (), then applying a load from an electromagnetic-force generator () to a supporting member () in a direction as to separate the probe () from the object () while gradually increasing an electric current supplied to the electromagnetic-force generator (), obtaining a value of the electric current supplied to the electromagnetic-force generator () when the probe () is separated from the object (), and converting the value of the electric current into a surface force acting between the probe () and the object ().


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