The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Mar. 19, 2014
Applicant:
United Technologies Corporation, Hartford, CT (US);
Inventors:
James M. Koonankeil, Marlborough, CT (US);
Gordon Miller Reed, Plantsville, CT (US);
Rodney H. Warner, Austin, TX (US);
Assignee:
United Technologies Corporation, Farmington, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/63 (2013.01);
Abstract
A method of non-destructively inspecting an article includes scanning an article to produce a computerized three-dimensional representation of an internal feature of the article. A measurement characteristic of the internal feature is then generated from a plurality of cross-sections through the computerized three-dimensional representation of the internal feature. The measurement characteristic is then used to determine whether the internal feature meets a design criterion.