The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Feb. 18, 2011
Applicants:

Adrian Fehr, Los Altos, CA (US);

Nathaniel Joseph Mccaffrey, Hampton Falls, NH (US);

Stephen Turner, Menlo Park, CA (US);

Inventors:

Adrian Fehr, Los Altos, CA (US);

Nathaniel Joseph McCaffrey, Hampton Falls, NH (US);

Stephen Turner, Menlo Park, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/77 (2006.01); B01L 3/00 (2006.01); G01N 21/75 (2006.01); B82Y 20/00 (2011.01); G01N 33/543 (2006.01); G02B 6/122 (2006.01); G01N 21/03 (2006.01); G01N 21/05 (2006.01); C12Q 1/68 (2006.01); H01L 27/144 (2006.01);
U.S. Cl.
CPC ...
G01N 21/77 (2013.01); B01L 3/502707 (2013.01); B01L 3/502715 (2013.01); B82Y 20/00 (2013.01); C12Q 1/6825 (2013.01); C12Q 1/6869 (2013.01); C12Q 1/6874 (2013.01); G01N 21/03 (2013.01); G01N 21/0303 (2013.01); G01N 21/05 (2013.01); G01N 21/64 (2013.01); G01N 21/645 (2013.01); G01N 21/648 (2013.01); G01N 21/6428 (2013.01); G01N 21/6452 (2013.01); G01N 21/6454 (2013.01); G01N 21/6456 (2013.01); G01N 21/75 (2013.01); G01N 33/54373 (2013.01); G02B 6/1226 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/168 (2013.01); G01N 2021/0346 (2013.01); G01N 2021/6434 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6441 (2013.01); G01N 2021/6463 (2013.01); G01N 2021/757 (2013.01); G01N 2201/067 (2013.01); G01N 2201/08 (2013.01); Y10T 436/143333 (2015.01);
Abstract

Optics collection and detection systems are provided for measuring optical signals from an array of optical sources over time. Methods of using the optics collection and detection systems are also described.


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