The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Jun. 20, 2013
Paul J. Zombo, Cocoa, FL (US);
James F. Landy, Cape Canaveral, FL (US);
Joseph L. Rose, State College, PA (US);
Steven E. Owens, Bellefonte, PA (US);
Fei Yan, State College, PA (US);
Cody J. Borigo, State College, PA (US);
Paul J. Zombo, Cocoa, FL (US);
James F. Landy, Cape Canaveral, FL (US);
Joseph L. Rose, State College, PA (US);
Steven E. Owens, Bellefonte, PA (US);
Fei Yan, State College, PA (US);
Cody J. Borigo, State College, PA (US);
SIEMENS ENERGY, INC., Orlando, FL (US);
FSB INC., State College, PA (US);
Abstract
Methods and systems () based on guided wave thermography for non-destructively inspecting structural flaws that may be present in a structure (). For example, such systems and methods may provide the ability to selectively deliver sonic or ultrasonic energy to provide focusing and/or beam steering throughout the structure from a fixed transducer location (). Moreover, such systems and methods may provide the ability to selectively apply sonic or ultrasonic energy having excitation characteristics (FIGS.and) which may be uniquely tailored to enhance the thermal response (FIGS.and) of a particular flaw geometry and/or flaw location.