The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Mar. 15, 2013
Raven Industries, Inc., Sioux Falls, SD (US);
John Earl Acheson, Sioux Falls, SD (US);
Stephen Filip Fjelstad, Worthing, SD (US);
Douglas Samuel Prairie, Sioux Falls, SD (US);
Raven Industries, Inc., Sioux Falls, SD (US);
Abstract
A dynamic yield monitor system includes a plurality of instruments to measure harvested crop characteristics while a crop is in-flow within a harvester elevator. The system includes a volume instrument that measures a harvested crop volume from the in-flow harvested crop within the harvester elevator, and a weight instrument that measures a harvested crop weight from the in-flow harvested crop within the harvester elevator. Optionally, the system includes other instruments including a moisture and temperature instrument. A receiver and processing node communicates with the instrument. The receiver and processing determines variable harvested crop test weight based on at least the measured harvested crop volume and measured harvested crop weight of the in-flow crop. The receiver and processing node further determines a variable yield of the harvested crop based on the measured harvested crop volume, the measured harvested crop weight, and the variable harvested crop test weight.